BEGIN:VCALENDAR
PRODID:-//AT Content Types//AT Event//EN
VERSION:2.0
METHOD:PUBLISH
BEGIN:VEVENT
DTSTAMP:20120208T122606Z
CREATED:20091214T213451Z
UID:ATEvent-d1f47fc67c975342db81733fd2b726fd
LAST-MODIFIED:20091214T213752Z
SUMMARY:2010 DC Area FIB SEM Users Group Meeting
DTSTART:20100225T133000Z
DTEND:20100226T170000Z
DESCRIPTION:Washington DC-area Focused Ion Beam / Scanning Electron Mi
 croscope Users Meeting for 2010
LOCATION:National Institute of Standards and Technology\, Gaithersburg\, MD
CONTACT:Keana Scott\, (301) 975-4579\, keana.scott@nist.gov
URL:http://www.fibsem.org/index.php?p=1_2_Meetings
CLASS:PUBLIC
END:VEVENT
END:VCALENDAR