BEGIN:VCALENDAR
PRODID:-//AT Content Types//AT Event//EN
VERSION:1.0
BEGIN:VEVENT
DTSTART:20100225T133000Z
DTEND:20100226T170000Z
DCREATED:20091214T213451Z
UID:ATEvent-d1f47fc67c975342db81733fd2b726fd
SEQUENCE:0
LAST-MODIFIED:20091214T213752Z
SUMMARY:2010 DC Area FIB SEM Users Group Meeting
DESCRIPTION:Washington DC-area Focused Ion Beam / Scanning Electron Mi
 croscope Users Meeting for 2010
LOCATION:National Institute of Standards and Technology\, Gaithersburg\, MD
PRIORITY:3
TRANSP:0
END:VEVENT
END:VCALENDAR