MicroNews Nov/Dec 1995

MicroNews

November/December 1995 Newsletter

of the Microbeam Analysis Society

____________________________________________________________________

____________________________________________________________________

PRESIDENT'S MESSAGE

Dear Members:

As we begin the new year, it is useful to reflect on the two major changes taking place in the activities of our society.

First, as you know from the previous issue of MicroNews, the Journal of Microbeam Analysis has now been incorporated into the Journal of the Microscopy Society of America. The various factors behind this decision have all been discussed before and I want now to look ahead to the next stages of this relationship. A key element in making this new arrangement the great success that it can be will be the position of the MAS Associate Editor of JMSA. I am very pleased that Charles Lyman of Lehigh University has agreed to accept this appointment. Charlie is just finishing his term as Director of MAS, has a long history of contribution to both our societies and in particular has been an important participant in the discussions and decisions regarding publication opportunities for our members. Under the overall leadership of Editor-in-Chief, Jean-Paul Revel, and Co-Editor, Ray Carpenter, and with the important role that Charlie Lyman will play as MAS Associate Editor, The Journal of the Microscopy Society of America, now incorporating Microbeam Analysis, should become one of the premier journals in the field. I urge you to give this journal your full support and particularly to consider it the first choice for publication of your most important publications relating to microscopy and microanalysis.

Second, but equally important to the future of our Society, 1996 will be the first year of our long-term joint sponsorship with MSA as well as other societies, of the Microscopy and Microanalysis national meeting. This year Microscopy and Microanalysis 96 will be held in Minneapolis, Minnesota, August 11 to 15, 1996. As in the case of journal publication, the success of this new approach to our participation in the national joint meeting will be critically dependent on the role of a few individuals, in this case the MAS program representatives. Again, we are very fortunate in that Joe Michael (as MAS program chair) and Jon McCarthy (as MAS program co-chair) are providing the strong leadership that will insure that, in the new coordinated single program format, topics of particular interest to MAS will be

well represented. I hope that you are already incorporating the Microscopy and Microanalysis 96 meeting into your summer plans. Scientifically and technically, I guarantee that you will not be disappointed, and as a native "Minnesotan", I can also assure you that it is a great place to visit, particularly with a family.

In the context of the above two major changes, the MAS council is continuing to explore the most effective ways for the Society to be of service to its members. In particular, the future role and varied nature of MAS topical conferences will be an important item of discussion. The first such topical conference, under the leadership of John Mansfield will be held at the Microscopy & Microanalysis 96 meeting and will focus on the role of the World Wide Web in the Microanalytical Sciences. Watch for details in the program announcement.

Finally, if you have concerns or observations about the above changes and particularly if you have suggestions regarding the future role of the Society, I strongly urge you to communicate them to me or any of the MAS Council members. This is an important time in the history of the Society. We need your input.

Dale E. Johnson

President

MAS MEMBERSHIP

VCH publishers no longer handles membership applications and renewals for MAS. Please do not use the old membership forms from 1995 and earlier. Bill Thompson is now handling membership and all applications and renewals should be sent to "Microbeam Analysis, PO Box 502, Fairport NY 14450". Membership services are still available at 1-800-4MASMEM or scott.wight@nist.gov to answer questions and solve problems.

PITTCON '96

March 3 - 8, 1996

Chicago, IL

Contact: (412) 825-3220

(412) 825-3224 FAX

ARIZONA IMAGING & MICROANALYSIS SOCIETY (AIMS) ANNUAL MEETING AND 3RD IMAGING WORKSHOP

March 12 - 15, 1996

Tucson, AZ

Contact: Claire Payne

Department of Microbiology and Immunology

University of Arizona

Tucson, AZ 85724

(520) 626-2870

(520) 626-2100 FAX

cpayne@ccit.arizona.edu

MATERIALS RESEARCH SOCIETY (MRS)

April 8 - 12, 1996

San Francisco, CA

Contact: Materials Research Society

9800 McKnight Road

Pittsburgh, PA 15237-6006

(412) 367-4373 FAX

SCANNING 96

April 9 - 12, 1996

Monterey, CA

Contact: Mary K. Sullivan

Scanning 96

P.O. Box 832

Mahwah, NJ 07430

(201) 818-1010

(201) 818-0086 FAX

fams@holonet.net

18TH INTERNATIONAL CONFERENCE ON CEMENT MICROSCOPY (ICMA)

April 21 - 25, 1996

Houston, TX

Contact: Louis A. Jany

(610) 926-1024

(610) 926-1906 FAX

JOINT APPALACHIAN REGIONAL MICROSCOPY SOCIETY (AREMS) / SOUTHEASTERN MICROSCOPY SOCIETY (SEMS) SPRING MEETING

April 23 - 26, 1996

Greenville, SC

Contact: JoAn Hudson

Clemson EM Facility

(803) 656-2465

(803) 656-0245 FAX

hjoan@clemson.clemson.edu

EDITOR'S NOTE

With this issue, I transfer the reigns of MicroNews Editor to Ryna Marinenko. Due to the incorporation of the Journal of Microbeam Analysis into the Journal of the Microscopy Society of America, MicroNews will once again be distributed to MAS members through special mailings 3 times per year. MicroNews can also be accessed on the World Wide Web (http://www-personal.engin.umich.edu/~jfmjfm/mas_folder/mashomepage.html). I have enjoyed being the MicroNews Editor for the past three years and look forward to serving the Microbeam Analysis Society in new ways in the years to come. Please direct your MicroNews comments and contributions to:

Ryna B. Marinenko

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3901 FAX: (301)216-1134

ryna.marinenko@nist.gov

Inga Holl Musselman

MicroNews Editor

MEETING AND SHORT COURSE

CALENDAR

Meetings

WINTER WORKSHOP ON ELECTRON DIFFRACTION AND IMAGING OF SURFACES

January 3 - 6, 1996

Scottsdale, AZ

Contact: Mrs. Sharon Willison

Center for Solid State Science

Arizon State University

Box 871704

Tempe, AZ 85287-1704

14th AUSTRALIAN CONFERENCE ON ELECTRON MICROSCOPY (ACEM-14) & 1ST MEETING OF THE INTERNATIONAL UNION OF MICROBEAM ANALYSIS (IUMAS)

February 5 - 9, 1996

Sydney, Australia

Contact: Maret Vesk

ACEM-14 - microCOSMOPOLITAN

E. M. Unit

University of Sydney

NSW 2006

(+61 2) 351 2351

(+61 2) 552 1967

maret@emu.su.oz.au

SCANNING MICROSCOPY 1996

May 11 - 16, 1996

Bethesda, MD

Contact: Scanning Microscopy International

PO Box 66507

Chicago (A.M.F. O'Hare), IL 60666-0507

(708) 529-6677

(708) 980-6698

73211.647@compuserve.com

40TH INTERNATIONAL CONFERENCE ON ELECTRON, ION, AND PHOTON BEAM TECHNOLOGY AND NANOFABRICATION

May 28 - 31, 1996

Atlanta, GA

Contact: Don Tennant

AT&T Bell Labs

Rm. 4D-325

101 Crawford Corner Road

Holmdel, NJ 07733

(908) 949-5007

(908) 949-8988 FAX

dmt@hogpa.att.com

SURFACE ANALYSIS '96, 18TH SYMPOSIUM ON APPLIED SURFACE ANALYSIS (TOPICAL CONFERENCE)

June 12 - 14, 1996

Ann Arbor, MI

Contact: Steve Simko

General Motors R&D Center

Analytical Chemistry, Bldg. 1-6

30500 Mound Road

Warren, MI 48090-9055

(810) 989-0810

(810) 986-0817 FAX

simko@gmr.com

9TH INTERNATIONAL CONFERENCE ON QUANTITATIVE SURFACE ANALYSIS (TOPICAL CONFERENCE)

July 15 - 19, 1996

Surrey, England

Contact: Prof. J. E. Castle

University of Surrey

Dept. of Mtrls. Sci. and Engr.

Guildford, Surrey GU2 5XH

U.K.

(44) 1483-259150

(44) 1483-259508

j.castle@surrey.ac.uk

MICROSCOPY & MICROANALYSIS 96

Sponsored by MSA, MAS and MSC/SMC

August 11 - 15, 1996

Minneapolis, MN

Contact: MSA Business Office

(508) 540-5594, (800) 538-3672

(508) 548-9053 FAX

AMERICAN VACUUM SOCIETY (AVS) 43RD NATIONAL SYMPOSIUM

October 14 - 18, 1996

Philadelphia, PA

Contact: AVS

120 Wall Street, 32nd Floor

New York, NY 10005

(212) 248-0200

avsnyc@vacuum.org

MICROSCOPY & MICROANALYSIS 97

Cleveland, OH

Short Courses

PRACTICAL ASPECTS OF SCANNING ELECTRON MICROSCOPY (PASEM 96)

March 18 - 22 , 1996 Session I

March 25 - 29, 1996 Session II

College Park, MD

Contact: Tim Maugel

University of Maryland

Department of Zoology

College Park, MD 20742

(301) 405-6896

(301) 314-9358 FAX

PROTOCOLS IN MICROSCOPIC IMAGING, IMMUNOCYTOCHEMISTRY AND IMAGE ANALYSIS

June 4 - 7, 1996

Washington, DC

Contact: Fred G. Lightfoot

George Washington University

(202) 994-2881

(202) 994-8885 FAX

LEHIGH MICROSCOPY COURSES

SEM, X-RAY ANALYSIS, AEM, AFM

June 10 - 14, 1996 SEM and X-Ray Microanalysis

June 17 - 20, 1996 Advanced SEM, Quantitative X-Ray Microanalysis, AEM

June 18 - 21, 1996 Atomic Force Microscopy and other Scanned Probe Microscopies

Bethlehem, PA

Contact: Professor David B. Williams

Department of Materials Science and Engineering

Lehigh University

5 E. Packer Avenue

Bethlehem, PA 18015-3195

(610) 758-5133

(610) 758-4244 FAX

interSEM@lehigh.edu

12TH ANNUAL SHORT COURSE ON MOLECULAR MICROSPECTROSCOPY

June 24 - 28, 1996

Miami, FL

Contact: Miami University

(513) 529-2874

(513) 529-7284 FAX

Microbeam Mass Spectrometry (Susan Mackay, Steve Brian)

Scanning Probe Microscoy: Instrumentation and Applications (Inga Musselman, Phil Russell)

Applications of Low Vacuum/Environmental SEM (John Mansfield, Stuart McKernan)

Microscopy and Microanalysis of Ceramics (C. B. Carter, John Bruley)

High Resolution Field Emission SEM in Materials Science (D. C. Joy, Jim Pawley)

Grain Boundary MicroEngineering (David A. Smith, Doug Perovic)

Joe Michael

Program Committee

MAS TOUR SPEAKER SCHEDULE FOR 1995-1996 (as of 12/5/95)

AFFILIATED SPEAKER SPEAKER DATE

REGIONAL 1 2

SOCIETY

AIMS Mansfield McCarthy 3/14/96

AREMS not this year

AusMAS (none)

CanMAS (none)

CleveMAS ? ? ?

CoMAS McCarthy Bigelow Spring '96

IAS Mansfield 12/13/95

LSM 10/20/95

M2S Mansfield 10/25/95

M3S Mansfield Bigelow Spring '96

MAMAS Mansfield Bigelow April '96?

MASSOC McCarthy Mansfield Spring '96

MEMS McCarthy Bigelow Spring '96

MIKMAS McCarthy Mansfield 11/10/95

MMS Mansfield* McCarthy Spring '96

MSORV Bigelow 3/22/96

NCSEMMA Mansfield Bigelow 9/96 3rd wk

NESEM McCarthy Mansfield 12/6/95

NMMBUG ? ? Spring '96

OMS McCarthy Bigelow 4/5/96

SEMS not this year

WestMAS Mansfield Bigelow early May '96

MICROSCOPY AND MICROANALYSIS 96

August 11 - 15, 1996

Microscopy and Microanalysis 96 is the title of the MAS/MSA joint meeting to be held in Minneapolis. The theme of the meeting is Challenges in Microscopy and Microanalysis. The Meeting Executive Committee consists of Nestor Zaluzec - Program Chair, Ruth Dimlich - program co-chair and Joe Michael - MAS Program co-chair. This is the first time that MAS and MSA will hold a joint meeting where there are no symposium specifically designated as MSA or MAS. We hope to present a much more coherent meeting in this way and to reduce the number of parallel sessions.

Here are some of the exciting symposium for the 1996 meeting:

MAS Presidential Symposium - Training the Scientists and Engineers of Tommorrow - The Changing Scene

Recent Advances in AEM for the Physical and Biological Sciences (Jim Bentley, Meredith Bond)

Optical and FT/IR Microscopy in Materials and Life Sciences (John Reffner, E. Neil Lewis)

High Resolution XRD and XRF (Brian York)

Bulk Specimen Microanalysis - Current Status and Prospects for the Future (John Small, Ian Anderson)

MICROBEAM ANALYSIS SOCIETY

Budget for 1996* Income and Expense

INCOME

Members Dues* (550 Regular, 32 Student, 9 Emeritus) $ 13875

Sustaining Members (41) 14350

Paper Award Reimbursement 1500

Investment Income (Schwab & Rochester Bank) 6000

Transfer from Assets/Investments 8775

_____

Total $ 44500

EXPENSE

Computer (WWW Communications) 6000

Student Support at MAS '96 3500

Business and Solicitation Expenses (Thompson) 1000

Executive Council 11000

Winter Council and Annual Meeting

Affiliates, Sustaining Members

Dues Solicitation and Accounting Functions (Thompson) 1500

Nat'l Conference, Topical Sessions ('96, '97) 4000

Tour Speakers 6000

Paper Presentation Awards, MAS '95 1500

Bank Charges, VISA/MC 300

MicroNews Expenses 4000

IUMAS Tour Speaker & Student Travel 3000

Computer Workshop '96 2000

Insurance 700

_____

Total $ 44500

*Reflects decrease of dues to $25/regular member and other decisions from Council and Annual Business Meetings at MAS '95.

______________________________

NOTE: All dues and correspondence previously sent to VCH should now be directed to William S. Thompson, c/o Microbeam Analysis Society, P.O. Box 502, Fairport, NY 14450-0502.

______________________________

Revised 9/13/95 Harvey A. Freeman, Treasurer

958 Long Pond Road, Brewster, MA 02631

(508) 896-9060

MAS EXECUTIVE COUNCIL

President

Dale E. Johnson

Graduate School AG-10

University of Washington

Seattle, WA 98195

(206)543-5900 FAX: (206)685-3234

dej@u.washington.edu

Past-President

Jon McCarthy

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)831-2313

jonm@noran.com

Treasurer

Harvey A. Freeman

958 Long Pond Road

Brewster, MA 02631-1898

(508)896-9060 FAX: (508)432-8951

harvey.freeman@um.cc.umich.edu

Secretary

David S. Simons

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3903 FAX: (301)216-1134

david.simons@nist.gov

DIRECTORS

Joanna L. Batstone (1993-1995)

IBM T. J. Watson Research Center

P. O. Box 704

Yorktown Heights, NY 10598

(914)784-7674 FAX: (914)784-6324

joanna@watson.ibm.com

Charles E. Lyman (1993-1995)

Department of Materials Science and Engineering

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015

(610)758-4249 FAX: (610)258-4244

cel1@lehigh.edu

Paul F. Hlava (1994-1996)

Sandia National Laboratories

Department 1822, MS-1405

Albuquerque, NM 87185-1405

(505)844-1890 FAX: (505)844-2974

pfhlava@sandia.gov

Carol Swyt (1994-1996)

National Institute of Standards and Technology

Bldg 222, Rm. A113

Gaithersburg, MD 20899

(301) 975-3926 FAX: (301)216-1134

swyt@gapnet.nist.gov

Joseph D. Geller (1995-1997)

426e Boston Street

Topsfield, MA 01983-1212

(508)887-7000 FAX: (508)887-7000

geller@world.std.com

John F. Mansfield (1995-1997)

University of Michigan, North Campus EMAL, 413 SRB

2455 Hayward

Ann Arbor, MI 48109-2143

(313)936-3352 FAX: (313)936-3352

jfmjfm@umich.edu

ADDITIONAL MAS REPRESENTATIVES

Accountant, Dues and Mailing List

William S. Thompson

c/o Microbeam Analysis Society

P.O. Box 502

Fairport, NY 14450-0502

(716)586-4985

Affiliated Regional Societies

Paul Hlava (see Directors)

(505)844-1890 FAX: (505)844-2974

Awards Committee for MAS 1996

Paul F. Hlava (see Directors)

(505)844-1890 FAX: (505)844-2974

Carol Swyt (see Directors)

(301) 975-3926 FAX: (301)216-1134

Computer Activities Committee

John F. Mansfield (see Directors)

(313)936-3352 FAX: (313)763-5567

Paul Carpenter

paulc@arms.gps.caltech.edu

(818)395-6126 FAX: (818)568-0935

Conference Proceedings Inventory

C. Susskind

San Francisco Press, Inc.

Box 6800

San Francisco, CA 94101-6800

(510)524-1000

Corporate Liason Committee

Thomas G. Huber

JEOL (USA) Inc.

11 Dearborn Road

Peabody, MA 01960

(508)535-5900 FAX:(508)536-2205

Education Committee

Phillip E. Russell

Department of Materials Science and Engineering

P.O. Box 7916

North Carolina State University

Raleigh, NC 27695-7916

(919)515-7501 FAX: (919)515-2932

Finance Committee, Archivist

Gordon Cleaver

GE Vallecitos Nuclear Center

P. O. Box 460, MC V08

Pleasanton, CA 94566

(510)862-4320 FAX: (510)862-4244

Historian

Art Chodos

302 Acorn Circle

Monrovia, CA 91016-1807

(818)237-0183

artc@cco.caltech.edu

International Liaison

David B. Williams

Department of Materials Science and Engineering

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015-3195

(610)758-4224 FAX: (610)758-4244

Long Range Planning Committee

John A. Small

National Institute of Standards and Technology

Bldg 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3900 FAX: (301)216-1134

MAS-MSA Liason, Nominations and

Presidents Award

Dale Johnson (see President)

(206)543-5900 FAX: (206)685-3234

Membership Services

Scott Wight

P.O. Box 3552

Gaithersburg, MD 20885

1-800-4-MASMEM

scott.wight@nist.gov

Microbeam Analysis Journal

Richard W. Linton, Editor-in-Chief

Department of Chemistry - CB3290

University of North Carolina

Chapel Hill, NC 27599-3290

(919)962-4619 FAX: (919)962-0488

rwl@ga.unc.edu

MicroNews Editor

Inga Holl Musselman

Chemistry Program, BE 26

University of Texas at Dallas

P. O. Box 830688

Richardson, TX 75083-0688

(214)883-2706 FAX: (214)883-2925

imusselm@utdallas.edu

Sustaining Membership Committee

Jack L. Worrall

CEMMA 103

University of Southern California

Los Angeles, CA 90089-0101

(213)740-1990

HONORARY MEMBERS

L. S. Birks (Deceased)

I. B. Borovskii (Deceased)

Raimond Castaing

Arthur A. Chodos

V. E. Cosslett (Deceased)

Peter Duncumb

Charles E. Fiori (Deceased)

Theodore Hall

K. F. J. Heinrich

James Hillier

L. L. Marton (Deceased)

Robert E. Ogilvie

Jean Philibert

Stephen J. B. Reed

Gunji Shinoda (Deceased)

David B. Wittry

Georges Slodzian

AFFILIATED REGIONAL SOCIETIES

Full Name (Acronym)

Contact

Address

Phone/FAX

email

MAS Liaison Director

Appalachian Region Electron Microscopy Society (AREMS)

Tom Richards (President)

3724 Merrifield Rd.

Charlotte, NC 28211

(704)364-8219

totom@aol.com

Swyt

Arizona Imaging and Microanalysis Society (AIMS)

Claire Payne (President)

Department of Micbiology & Immunology

Room 6111

College of Medicine

University of Arizona

Tucson, AZ 85724

(520)626-2870 FAX: (520)626-2100

cpayne@ccit.arizona.edu

Lyman

Canadian Microbeam Analysis Society (CanMAS)

Rod Packwood

MTL - Canmet - EMR

555 Booth Street

Ottawa, Ontario K1A 091, Canada

(613)992-2288 FAX: (613)992-8735

Swyt

Cleveland Microbeam Analysis Society (CleveMAS)

James D. Eisner

The Geon Co.

Avon Lake Technical Center

P. O. Box 122

Avon Lake, OH 44012

(216)930-1605 FAX: (216)930-1644

Swyt

Colorado Microbeam Analysis Society (CoMAS)

Greg Meeker (MAS Rep)

US Geological SurveyMS903

Denver Federal Center

Box 25046

Denver, CO 80225

(303)236-1081 FAX: (303)236-1414

(303)236-3187 Probe Lab

gmeeker@usgsprobe.cr.usgs.gov

Geller

Instrumental Analysis Society (IAS)

Liz Goodwin (Secretary)

R. J. Lee Instruments

515 Pleasant Valley Road

Trafford, PA 15085

(412)744-0100 FAX: (412)744-0506

Lyman

Louisiana Society for Microscopy (LSM)

Joe Mascorro (President)

Department of Anatomy

Tulane University - School of Medicine

1430 Tulane Avenue

New Orleans, LA 70112

(504)584-2747 FAX: (504)584-1687

jmascor@mailhost.tcs.tulane.edu

Lyman

Metropolitan Microscopy Society (M²S)

Phillip L. Flaitz (Co-Chairman)

IBM Analytical Services Group

1580 Route 52 - Z/E40

Hopewell Junction, NY 12533

(914)892-3094 FAX: (914)892-2555

pflaitz@vnet.ibm.com

Batstone

Michigan Electron Microscopy Society (MEMS)

John Blackson (President)

MEMS President

The Dow Chemical Company

Building 1897

Midland MI 48667

(517)636-6316 FAX: (517)638-6443

blacksonjohn@dow.com

Mansfield

Microbeam Analysis Society of Australia (AusMAS)

Clive Nockolds

Electron Microscope Unit

University of Sydney

Sydney, NSW, Australia

61-02-351-2351 FAX: 61-02-552-1967

clive@emu.su.oz.au

Swyt

Microbeam Analysis Society of Southern California (MASSoC)

Paul K. Carpenter (Treasurer)

Department of Geology 170-25

Caltech

Pasadena, CA 91125

(818)395-6126 FAX: (818)568-0935

paulc@arms.gps.caltech.edu

Hlava

Microscopy Society of the Ohio River Valley (MSORV)

Scott D. Walck

Materials Directorate

2941 P St Ste 1

WL/MLBT, BLDG 654

Wright Patterson Air Force Base, OH 45433-7750

(513)255-5791 FAX: (513)255-2176

walcksd@ml.wpafb.af.mil

Batstone

Mid-Atlantic Microbeam Analysis Society (MAMAS)

Ryna Beth Marinenko

National Institutes of Science and Technology

Bldg. 222, Room A113

Gaithersburg, MD 20899

(301)975-3901 FAX: (301)216-1134

marinenko@gapnet.nist.gov

Batstone

Midwest Microscopy and Microanalysis Society (M3S)

Nestor J. Zaluzec

Electron Microscopy for Materials Research

Argonne National Laboratory

Material Science Division - Bldg. 212

9700 South Cass Ave.

Argonne, IL 60439

(708)252-5075 FAX: (708)252-4798

zaluzec@aaem.amc.anl.gov

Mansfield

Minnesota Microscopy Society (MMS)

Michael Coscio (MAS Representataive)

C/O Medtronic Inc./Promeon Division

6700 Shingle Creek Drive

Brooklyn Center, MN 55430

(612)569-1331 FAX: (612)569-1284

mike.coscio@medtronic.com

Mansfield

Missouri-Illinois-Kansas Microbeam Analysis Society (MIKMAS)

Donald Parker (Chairman)

Monsanto Company

800 N. Lindbergh Blvd.

Mail Zone U1E

St. Louis, MO 63167

(314)694-4974 FAX: (314)694-6727

dlpark1@ccmail.monsanto.com

Mansfield

New England Society for Electron Microscopy (NESEM)

Ms. Rebecca Stearns (President-Elect)

New England Society for Electron Microscopy

P. O. Box 5067

Billerica, MA 01822

(617)432-1667 FAX: (617)432-0014

stearreb@hsphsun2.harvard.edu

Geller

New Mexico Microbeam Users Group (NMMBUG)

Paul Frank Hlava

Department 1822, MS-1405

Sandia National Laboratories

Albuquerque, NM 87185-1405

(505)844-1890 FAX: (505)844-2974

pfhlava@sandia.gov

Geller

North Carolina Society for Electron Microscopy and Microbeam Analysis (NCSEMMA)

Phillip Russell

Department of Materials Science and Engineering

Campus Box 7916

North Carolina State University

Raleigh, NC 27695-7916

(919)515-7501 FAX: (919)515-6965

prussell@ncsu.edu

Swyt

Oklahoma Microscopy Society (OMS)

Ginger Baker (Secretary-Treasurer)

Department of PHSI

264 Veterinary Medicine

Oklahoma State University

Stillwater, OK 74078-0353

(405)744-6765 FAX: (405)744-8263

lizard@vms.ucc.okstate.edu

Hlava

SouthEastern Microscopy Society (SEMS)

W. Gray "Jay" Jerome (President)

Department of Pathology

Bowman Gray Medical School

Wake Forest University

Winston-Salem, NC 27157

(910)716-4972 FAX: (910)716-6174

jjerome@isnet.is.wfu.edu

Swyt

West Coast Microbeam Analysis Society (WestMAS)

Charles Gordon Cleaver, Jr.

GE Vallecitos Nuclear Center

PO Box 460 MC V08

Pleasanton, CA 94566

(510)862-4320 FAX: (510)862-4516

Hlava

SUSTAINING MEMBERS

Our Sustaining Members Contribute Substantial Support to MAS

4pi Analysis, Inc.

3500 Westgate Drive, Suite 403

Durham, NC 27707

(919)489-1757 FAX: (919)489-1487

Contact: Michael Czysz / Scott Davilla

Mac-based EDS & Imaging, Hard- and Software

Advanced MicroBeam, Inc.

4217 C Kings-Graves Road, P. O. Box 610

Vienna, OH 44473

(216)394-1255 FAX: (216)394-1834

Contact: Donald P. Lesher

Microprobe Service, Automation, Image Analysis

Amray, Inc.

160 Middlesex Turnpike

Bedford, MA 01730

(617)275-1400 FAX: (617)275-0740

Contact: Kenneth Benoit / Sheldon Moll

Manufacturer of Scanning Electron Microscopes

Cameca Instruments, Inc.

204 Spring Hill Road

Trumbull, CT 06611-1356

(203)459-0623 FAX: (203)261-5506

Contact: Andrew Davis / Claude Conty

EPMA, SIMS, Analytical SEM, and FE/Auger

Charles Evans & Associates

301 Chesapeake Drive

Redwood City, CA 94063

(415)369-4567

Contact: Jeff Kingsley / Mike Edgell

Service Analysis Lab., Mass Spec., RBS

Dapple Systems

355 West Olive, Suite 100

Sunnyvale, CA 94086

(408)733-3283 FAX: (408)736-2350

Contact: William Stewart

EDS Systems, Image Capture and Analysis

Denton Vacuum, Inc.

1259 North Church Street

Moorestown, NJ 08057

(609)439-9100 FAX: (609)439-9111

Contact: George Lutz / James L. Campbell

Vacuum Coaters and Critical Point Dryers

EDAX International

91 McKee Drive

Mahwah, NJ 07430

(210)529-6277 FAX: (201)529-3156

Contact: Tony Williams / Paul Oravetz

Microanalysis Systems Utilizing PC or MAC

Electron Microscopy Sciences / Diatome US

321 Morris Road, P. O. Box 251

Fort Washington, PA 19034

(800)523-5874 (215)646-1566 FAX: (215)646-8931

Contact: Carole March / Stacie Kirsch

EM and LM Supplies and Diamond Knives

ETP-USA / Electron Detectors, Inc.

1650 Holmes Street, Building C

Livermore, CA 94550

(510)449-8534 FAX: (510)449-8996

Contact: Robert J. Ruscica

Robinson BSE Det. & Infrared Chamberview Sys.

FEI Company

7451 N.E. Evergreen Parkway

Hillsboro, OR 97124-5830

(503)640-7500 FAX: (503)640-7509

Contact: Andree Kraker / Doug Rathkey

LaB6 & CeB6 Tips, FIB & FIB/SEM Workstations

Fisons Instruments

24911 Avenue Stanford

Valencia, CA 91355

(805)295-0019 FAX: (805)295-8714

Contact: Joe Robinson / Mike Davidson

Energy-dispersive X-ray Analysis Systems

Gatan, Inc.

6678 Owens Drive

Pleasanton, CA 94588-3334

(510)463-0200 FAX: (510)463-0204

Contact: Peter Swann / Christopher Byrne

TEM Accessories and Specimen Prep. Equipment

Geller MicroAnalytical Laboratory

426E Boston Street

Topsfield, MA 01983-1200

(800)MICRO-LL (508)887-7000 FAX: (508)887-6671

Contact: Joseph D. Geller / Charles Herrington

EPMA,SEM/EDS,& Auger Services-EM Standards

Hessler Technical Services

44 Strawberry Hill Avenue, Suite 8G

Stamford, CT 06902

(203)358-0266 FAX: (203)358-0266

Contact: Robert Hessler

Sales and Marketing Representative

JEOL USA, Inc.

11 Dearborn Road

Peabody, MA 01960

(508)535-5900 FAX: (508)536-2205

Contact: Robert Santorelli / Charles Nielsen

EPMA, Auger, SEM, TEM, NMR, Mass Spec

RJ Lee Instruments Ltd.

515 Pleasant Valley Road

Trafford, PA 15085

(412)744-0100 FAX:(412)744-0506

Contact: David Crawford / Dr. Fred Schamber

PERSONAL SEM for failure analysis, QA, etc.

Lehigh University

Materials Science Department

5 East Packer Avenue

Bethlehem, PA 18015

(610)758-4249 FAX:(610)758-4244

Contact: David Williams / Charles Lyman

Education in SEM, AEM, AFM, & Microanalysis

Leica, Inc.

111 Deer Lake Road

Deerfield, IL 60015

(800)248-0123 (708)405-0123 FAX: (708)317-7268

Contact: Kevin Dauwalter / Norm Burns

SEM, Optical, & Scanning Confocal Microscopes

Materials Analytical Services, Inc.

3597 Parkway Lane, Suite 250

Norcross, GA 30092

(800)421-8451 (404)448-3200 FAX: (404)368-8256

Contact: Mark Rigler / Bill Longo

FTIR,EDXRF,S(TEM),SEM,FIB,STM&XRD Serv.

McCrone Associates, Inc.

850 Pasquinelli Drive

Westmont, IL 60559

(708)887-7100 FAX: (708)887-7417

Contact: Kent L. Rhodes / John Gavrilovic

Materials Characterization & Surface Analysis

Micron, Inc.

3815 Lancaster Pike

Wilmington, DE 19805-1599

(302)998-1184 FAX: (302)998-1836

Contact: James F. Ficca, Jr.

Analytical Services OM, SEM/EDS, TEM, & EPMA

Microspec Corporation

45950 Hotchkiss Street

Fremont, CA 94539

(510)656-8820 FAX: (510)656-8944

Contact: Joseph Carr / William D. Donnelly

Wavelength-Dispersive Spectrometers for SEMs

Nissei Sangyo America, Ltd.

Hitachi Scientific Instruments

775 Ravendale Drive

Mountain View, CA 94043

(415)969-1100 FAX: (415)961-0368

Contact: Donna Armanino / Hideo Naito

SEM, TEM, & Field-Emission SEM and TEM

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)836-7224

Contact: Gary Hawkinson / Mary Ales

Microanalysis Systems & Confocal Microscopes

Osmic, Inc.

1788 Northwood

Troy, MI 48084

(800)366-1299 (810)362-1290 FAX: (810)362-4043

Contact: Nick Grupido / George Gutman

Multilayer Crystals for WDS Spectrometers

Oxford Instruments, Inc.

Microanalysis Group

130 A Baker Avenue Ext.

Concord, MA 01742-2204

(508)369-9933 FAX: (508)369-8287

Contact: Helen Corry / John Benson

Link EDS Systems, EM Cryo Access., CL & BSD

Park Scientific Instruments

1171 Borregas Avenue

Sunnyvalle, CA 94089

(408)747-1600 FAX: (408)747-1601

Contact: Dave Campbell / John Yarboro

A Complete Line of Scanning Probe Microscopes

Physical Electronics Inc.

6509 Flying Cloud Drive

Eden Prairie, MN 55344

(800)328-7515 (612)828-6100 FAX: (612)828-6322

Contact: Greg Carpenter

Surface Analysis Inst., Auger, XPS, & SIMS

Philips Electronic Instruments

85 McKee Drive

Mahwah, NJ 07430

(201)529-3800

Contact: Nathan Little / John S. Fahy

XL Series SEMs and CM Series TEMs

Princeton Gamma-Tech

1200 State Road

Princeton, NJ 08540

(609)924-7310 FAX: (609)924-1729

Contact: Doug Skinner

EDS & Image Analysis for EM and OM

SEM / TEC Laboratories, Inc.

4824 South 35th Street

Phoenix, AZ 85040

(602)276-6138 FAX: (602)276-4558

Contact: Sam Giallanza / Ed Holdsworth

Materials & Failure Analysis Service Lab.

Small World

P.O. Box 25284

San Mateo, CA 94402

(415)345-8013 FAX: (415)345-8013

Contact: Don Chernoff

Electron Flight Simulator, EDS standards

Soft-Imaging Software Corporation

2102 Beach Court

Goldon, CO 80401

(303)274-0341 FAX:(303)274-0341

Contact: Dr. Michael Bode

Software & Hardware for Image Acquisition

Spectra-Tech / Nicolet

652 Glenbrook Road, P. O. Box 2190-G

Stamford, CT 06906

(203)357-7055 FAX: (203)357-1713

Contact: Jerry Hare / John A. Reffner

FT-IR Microscopes, Spectrometers, & Access.

SPI Supplies / Structure Probe, Inc.

569 E. Gay Street, P. O. Box 656

West Chester, PA 19381-0656

(800)242-4774 (610)436-5400 FAX: (610)436-5755

Contact: Kim Royer / Andrew Blackwood

EM Prep. Equipment and Supplies / Service Lab

C. M. Taylor Co.

1140 Blair Avenue

Sunnyvale, CA 94087

(408)245-4229 FAX: (408)732-1104

Contact: Ferren De Kildow / Dr. C. M. Taylor

Microprobe Analysis, Taylor Multi-Element Std.

Topcon Technologies, Inc.

65 West Century Road

Paramus, NJ 07652

(201)261-9450 FAX: (201)387-2710

Contact: Michael McCarthy / Frank Mannino

Digital SEM and UHR Digital SEM & TEM

Topometrix Corporation

5403 Betsy Ross Drive

Santa Clara, CA 95054

(408)982-9700 FAX: (408)982-9751

Contact: Tony Abbis / Paul West

Complete Line of Scanning Probe Microscopes

XEI Scientific

3124 Wesex Way

Redwood City, CA 94061

(415)369-0133

Contact: Ronald Vane

SEM-CLEAN Anti-contamination System for EM's

Carl Zeiss, Inc.

Electron Optical Division

One Zeiss Drive

Thornwood, NY 10594

(800)356-1090 FAX: (914)681-7443

Contact: Paul Henry / Frank Coccla

Transmission & Scanning Electron Microscopes