Microbeam Analysis Society

Incorporated in New York, 1968       ♦       FEIN 23-7044608


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Past Topical Conferences


Electron Backscattered Diffraction (EBSD)
May 20-22, 2008   ♦   Madison, WI
John Fournelle, Chair
University of Wisconsin-Madison
306a Weeks Hall for Geologic Science
1215 W Dayton Street
Madison WI 53706
Tel: +1 608 262 7964
Fax: +1 608 262 0693
Email: johnf-at-geology.wisc.edu
 


Hyperspectral Imaging II (HI-II)
October 23-26, 2007   ♦   Gaithersburg, MD
Ed Vicenzi, Chair
Smithsonian Institution
National Museum of Natural History
PO Box 37012, NHB-119
Washington DC 20013-7012
Tel: +1 202 633 1824
Fax: +1 202 357 2476
Email: vicenzie-at-si.edu
 


Particle Workshop 2006
April 24-26, 2006   ♦   Gaithersburg, MD
Nicholas Ritchie, Chair
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3929
Fax: +1 301 417 1321
Email: nicholas.ritchie-at-nist.gov
 


Variable Pressure and Environmental SEM
      for Imaging and Microanalysis
November 2-4, 2005   ♦   Gaithersburg, MD
Dale Newbury and Scott Wight, Chairs
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3921; +1 301 975 3949
Fax: +1 301 417 1321
Email: dale.newbury-at-nist.gov; scott.wight-at-nist.gov
 


Modeling Electron Transport for Applications
      in Electron and X-ray Analysis and Metrology
November 8-10, 2004   ♦   Gaithersburg, MD
Dale Newbury and Cedric Powell, Chairs
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3921; +1 301 975 2534
Fax: +1 301 417 1321
Email: dale.newbury-at-nist.gov; cedric.powell-at-nist.gov
 


Spectrum Imaging and Multispectral /
      Hyperspectral Data Analysis
April 28 - May 1, 2003   ♦   Gaithersburg, MD
John Henry Scott, Chair
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 4981
Fax: +1 301 417 1321
Email: johnhenry.scott-at-nist.gov
 


Understanding the Accuracy Barrier of
      Quantitative Electron Beam X-ray Microanalysis
            and the Role of Standards
April 8-11, 2002   ♦   Gaithersburg, MD
Dale Newbury and Ryna Marinenko, Chairs
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3921; +1 301 975 3901
Fax: +1 301 417 1321
Email: dale.newbury-at-nist.gov;
            ryna.marinenko-at-nist.gov
 


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