Microbeam Analysis Society

			Microbeam Analysis Society
			Incorporated in New York, 1968 ♦ FEIN 23-7044608

	News	Members	Meetings	Awards	Regional

	Students	Leadership	Journal	History	Resources


	MAS Distinguished Scholar Awards

Microscopy & Microanalysis 2008
Albuquerque, NM

Pooja Bajaj ♦ University of Texas at Dallas
Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon Nanotubes

Judy J. Cha ♦ Cornell University
Tunneling Magnetoresistance and B Diffusion in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELS

Michaela Eddy ♦ University of Michigan
Microbeam Analysis of Plasma Effects in Synthetic Mica-Like Compound

H. Carlo Floresca ♦ University of Texas at Dallas
New FIB Fold-Out Method for TEM Cross-Section Sample Preparation

Bryant R. Gipson ♦ University of California at Davis
2dx – Automated 3D Structure Reconstruction from 2D Crystal Data

James M. LeBeau ♦ University of California at Santa Barbara
Quantitative HAADF-STEM and EELS

Ben McMorran ♦ University of Arizona
Very Low Energy TEM Diffraction of Nanostructures

William D. Pyrz ♦ University of Delaware
Using Aberration-Corrected STEM Imaging to Explore Chemical and Structural Variations in the M1 Phase of the MoVNbTeO Oxidation Catalyst

Weronika Walkosz ♦ University of Illinois at Chicago
Investigation of the Atomic Structures of Si₃N₄/CeO_2-d Interfaces using Atomic Resolution Z-Contrast Imaging and EELS Combined with First-Principles Methods

Huolin L. Xin ♦ Cornell University
Controlling Channeling Effects in Aberration-Corrected STEM Tomography

	Sustaining Members	MicroNews	Tour Speakers	Calendar	Annual Meeting